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Local Correlation and Entropy Maps as Tools for Detecting Defects in Industrial Images Cover

Local Correlation and Entropy Maps as Tools for Detecting Defects in Industrial Images

Open Access
|Mar 2008
DOI: https://doi.org/10.2478/v10006-008-0004-0 | Journal eISSN: 2083-8492 | Journal ISSN: 1641-876X
Language: English
Page range: 41 - 47
Published on: Mar 21, 2008
Published by: University of Zielona Góra
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2008 Ewa Skubalska-Rafajłowicz, published by University of Zielona Góra
This work is licensed under the Creative Commons License.

Volume 18 (2008): Issue 1 (March 2008)