Have a personal or library account? Click to login
Local Correlation and Entropy Maps as Tools for Detecting Defects in Industrial Images Cover

Local Correlation and Entropy Maps as Tools for Detecting Defects in Industrial Images

International Journal of Applied Mathematics and Computer Science
Volume 18 (2008): Issue 1 (March 2008)
By: Ewa Skubalska-Rafajłowicz  
Open Access
|Mar 2008
DOI: https://doi.org/10.2478/v10006-008-0004-0 | Journal eISSN: 2083-8492 | Journal ISSN: 1641-876X
Journal RSS Feed
Language: English
Page range: 41 - 47
Published on: Mar 21, 2008
Published by: University of Zielona Góra
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
Defects detection,
image processing,
local correlation,
entropy map
Related subjects:
Mathematics,
Applied mathematics

© 2008 Ewa Skubalska-Rafajłowicz, published by University of Zielona Góra
This work is licensed under the Creative Commons License.

Volume 18 (2008): Issue 1 (March 2008)