Two-layer structure consisting of AA (1) and CFRP (2) with EC probe (3): (a) without lift-off; (b) with lift-off hc; (c) with delamination d between the AA substrate and the CFRP layer.
Fig. 2.
Characteristic changes in the EC probe impedance in the complex plane: (a,b) as a function of the thickness tc of the CFRP layer on AA substrate and the lift-off h influence for non-magnetic materials; (c) as a function of delamination d.
Fig. 3.
(a) Flat AA specimen (1) with stacked CFRP plates (2) and ferrite core (3) with EC probe winding (4). (b) Scheme of the parallel resonant circuit with EC probe: 1 – driving generator; 2 – power amplifier; 3 – resistor; 4 – inductance of EC probe winding; 5 – capacitance of resonant circuit; 6 – band-pass filter; 7 – voltage indicator.
Fig. 4.
(a) Changes in the output voltage ΔU for the EC probe with 600 turns and (b) the corresponding dependencies of the sensitivity Stc on the thickness tc of the CFRP layer at operating frequencies of 5.0 and 8.5 kHz.
Fig. 5.
(a) Changes in the output voltage ΔU for the EC probe with 300 turns and (b) the corresponding dependencies of the sensitivity Stc on the thickness tc of the CFRP layer at operating frequencies of 14.0 and 20.5 kHz.