References
- Mońka, G. and Janowski, St. “Report on Work Entitled: Influence of Shot Peening Parameters on the Distribution of Residual Stresses (Rtg) in Carbon Steel of Various Hardness.” Institute of Precision Mechanics, Warsaw Institute of Technology. 2003.
- Mackiewicz, S. “X-ray Diffraction in Non-Destructive Testing – New European Standards.” National Conference on Radiographic Research, Popov 2005.
- Bunsch, A. X-ray Structural Analysis, Materials for Exercises, Part II, 2018, pp. 1–20, Crystallography and X-ray Laboratory, Department of Metal Science and Powder Metallurgy. Faculty of Metals Engineering and Industrial Computer Science, AGH University of Science and Technology, Krakow. Available at: www.kmimp.agh.edu.pl/pliki/AB_RAS_U.pdf.
- Szyrle, W. and Janowski, St. “Station for Measuring Residual Stress Distribution In Planar Elements.” Metal Science and Heat Treatment (1979): pp. 42–46.
- Birger, I.A. Ostatočnyje naprjaženia. Mašgis, Moskva,1963.
- Joanna, Krajewska-Śpiewak and Józef, Gawlik. Determination of Residual Stresses using the X-ray Method in Hard-to-Cut Materials, pp. 1–12. Available at: www.ptzp.org.pl/files/konferencje/kzz/artyk_pdf_2017/T1/t1-783.pdf.
- System 360 Scientific Subroutine Package (360-A-CM 03X) Version III. IBM Technical Publication Department, Fourth Edition (1970), New York.
- Mońka, G. and Janowski, St. Work Report Entitled: Report on the Possibility of Improving the Properties of Ceramics by the Method of Dynamic Surface Plastic Working Peening Institute of Precision Mechanics, 2004
- Mańczak, K. Technique of Planning an Experiment. WNT, Warsaw (1976).
- Piekarski, R. “Determination of Residual Stresses in the Surface Layer of 42CrMo4 Steel Machine Elements Subjected to Shot Peening.” Mechanik No 5, (2005): pp.102-106.
- Weisman, I. and Philips, A. “Simplified Measurement of Residual Stresses.” Proceedings of the Society Experimental Stress Analysis t. XI No 2 (1952): pp. 102.
- Laboratory of X-ray Diffraction, L-3-imim.pl. Available at: www.imim.pl/files.lab_akred/L3.pdf.