Control of Beam Deflection Measurement by Inductive Linear Transducer and Analysis of Results

This paper presents a compact and cost-effective measurement system for evaluating beam deflection using planar inductive linear transducers. The system includes a custom-built mechanical stand with a movable loading arm, force sensor, and non-contact displacement sensor mounted on linear guide rails. The setup allows precise positioning of the loading point and displacement measurement along the beam. A planar inductive sensor provides a 0–10 V analog output corresponding to a 0–1000 mm displacement range. Signals are acquired using a National Instruments DAQ system and processed in real time via LabVIEW. Bilateral sensing and noise-assisted signal processing techniques improve measurement accuracy and stability. Experimental validation demonstrated high repeatability and resolution better than 15 µm. The system supports applications in structural diagnostics, mechanical testing, and educational environments. Its modular design and low-cost implementation make it a practical alternative to conventional optical or contact-based measurement methods.