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Growth of Zn1−x
                     CdxO nanocrystalline thin films by sol-gel method and their characterization for optoelectronic applications Cover

Growth of Zn1−x CdxO nanocrystalline thin films by sol-gel method and their characterization for optoelectronic applications

Open Access
|Dec 2014

References

  1. [1] Ohta H., Hosono H., Mater. Today, 7 (2004), 42. http://dx.doi.org/10.1016/S1369-7021(04)00288-310.1016/S1369-7021(04)00288-3
  2. [2] Tang Z.K., Wong G.K.L., Yu P., Kawasaki M., Ohtomo A., Koinuma H., Segawa Y., Appl. Phys. Lett., 72(25) (1998), 3270. http://dx.doi.org/10.1063/1.12162010.1063/1.121620
  3. [3] Reddy K.T.R., Sravani C., Miles R.W., J. Cryst. Growth, 184–185 (1998), 1031. http://dx.doi.org/10.1016/S0022-0248(98)80215-710.1016/S0022-0248(98)80215-7
  4. [4] Park S.-H., Ryu J.-Y., Choi H.-H., Kwon T.-H., Sensor Actuat. B-Chem., 46(2) (1998), 75. http://dx.doi.org/10.1016/S0925-4005(97)00324-910.1016/S0925-4005(97)00324-9
  5. [5] Chung W.-Y., Sakai G., Shimanoe K., Miura N., Lee D.-D., Yamazoe N., Sensor Actuat. B-Chem., 46(2) (1998), 139. http://dx.doi.org/10.1016/S0925-4005(98)00100-210.1016/S0925-4005(98)00100-2
  6. [6] Sonawane B.K., Shelke V., Bhole M.P., Patil D.S., J. Phys. Chem. Solids, 72(12) (2011), 1442. http://dx.doi.org/10.1016/j.jpcs.2011.08.02210.1016/j.jpcs.2011.08.022
  7. [7] Mondal S., Kanta K.P., Mitra P., Journal of Physical Science, 12 (2008), 221.
  8. [8] Lieber C.M., Solid State Commun., 107 (1998), 607. http://dx.doi.org/10.1016/S0038-1098(98)00209-910.1016/S0038-1098(98)00209-9
  9. [9] Wang X.N., Wang Y., Mei Z.X., Dong J., Zeng Z.Q., Yuan H.T., Zhang T.C., Du X.L., Jia J.F., Xue Q.K., Zhang X.N., Zhang Z., Li Z.F., Lu W., Appl. Phys. Lett., 90(15) (2007), 151912. http://dx.doi.org/10.1063/1.272222510.1063/1.2722225
  10. [10] Ye J.D., Gu S.L., Zhu S.M., Qin F., Liu S.M., Liu W., Zhou X., Hu L.Q., Zhang R., Shi Y., Zheng Y.D., J. Appl. Phys., 96(9) (2004), 5308. http://dx.doi.org/10.1063/1.179175510.1063/1.1791755
  11. [11] Haga K., Suzuki T., Kashiwaba Y., Watanabe H., Zhang B.P., Segawa Y., Thin solid films, 433 (2003), 131. http://dx.doi.org/10.1016/S0040-6090(03)00327-410.1016/S0040-6090(03)00327-4
  12. [12] Vigil O., Vaillant L., Cruz F., Santana G., Morales-Acevedo A., Contreras-Puente G., Thin solid films, 361–362 (2000), 53. http://dx.doi.org/10.1016/S0040-6090(99)01061-510.1016/S0040-6090(99)01061-5
  13. [13] Ueda N., Maeda H., Hosono H., Kawazoe H., J. Appl. Phys., 84(11) (1998), 6174. http://dx.doi.org/10.1063/1.36893310.1063/1.368933
  14. [14] Lee S.Y., Li Y., Lee J.-S., Lee J.K., Nastasi M., Crooker S.A., Jia Q.X., Kang H.-S., Kang J.-S., Appl. Phys. Lett., 85(2) (2004), 218. http://dx.doi.org/10.1063/1.177181010.1063/1.1771810
  15. [15] Delgado G.T., Zuniga-Romero C.I., Sandoval O.J., Adv. Funct. Mater., 12 (2002), 129. http://dx.doi.org/10.1002/1616-3028(20020201)12:2<;129::AID-ADFM129>3.0.CO;2-V10.1002/1616-3028(20020201)12:2<;129::AID-ADFM129>3.0.CO;2-V
  16. [16] Khan Z.R., Khan M.S., Zulfequar M., Khan M.S., Mater. Sci. Appl., 2(5) (2011), 340. 10.4236/msa.2011.25044
  17. [17] Maity R., Chattopadhyay K.K., Sol. Energ. Mat. Sol. C, 90 (2006), 597. http://dx.doi.org/10.1016/j.solmat.2005.05.00110.1016/j.solmat.2005.05.001
  18. [18] Singh A., Kumar D., Khanna P.K., Kumar M., Prasad B., ECS J. Solid State Sci. Technol., 2(9) (2013), Q136. http://dx.doi.org/10.1149/2.001309jss10.1149/2.001309jss
  19. [19] Caglar Y., Caglar M., Ilican S., Ates A., J. Phys. D-Appl. Phys., 42 (2009), 065421. http://dx.doi.org/10.1088/0022-3727/42/6/06542110.1088/0022-3727/42/6/065421
  20. [20] Vijayalakshami S., Venkataraj S., Jayavel R., J. Phys. D-Appl. Phys., 41 (2008), 245403. http://dx.doi.org/10.1088/0022-3727/41/24/24540310.1088/0022-3727/41/24/245403
  21. [21] Zhang J., Zhao S.-Q., Zhang K., Zhou J.-Q., Cai Y.-F., Nanoscale Res. Lett., 7 (2012), 405. http://dx.doi.org/10.1186/1556-276X-7-40510.1186/1556-276X-7-405
  22. [22] Vanheusden K., Warren W.L., Seager C.H., Tallant D.R., Voigt J.A., Gnade B.E., J. Appl. Phys., 79(10) (1996), 7983. http://dx.doi.org/10.1063/1.36234910.1063/1.362349
  23. [23] Kohan A.F., Ceder G., Morgan D., Van De Walle C.G., Phys. Rev. B, 61(22) (2000), 15019. http://dx.doi.org/10.1103/PhysRevB.61.1501910.1103/PhysRevB.61.15019
DOI: https://doi.org/10.2478/s13536-014-0248-3 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 688 - 695
Published on: Dec 19, 2014
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2014 Munirah Munirah, Ziaul Khan, Mohd. Khan, Anver Aziz, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.