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Preparation and microstructural characterization of Si(100) Ce1−x GdxO2−δ thin films prepared by pulsed laser deposition technique Cover

Preparation and microstructural characterization of Si(100) Ce1−x GdxO2−δ thin films prepared by pulsed laser deposition technique

Materials Science-Poland
Volume 32 (2014): Issue 4 (December 2014)
By: P. Nagaraju,  Y. Vijayakumar,  D. Phase,  V. Reddy and  M. Ramana Reddy  
Open Access
|Dec 2014

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DOI: https://doi.org/10.2478/s13536-014-0246-5 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 541 - 546
Published on: Dec 19, 2014
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
cerium oxide,
dislocation densities,
gadolinium doped cerium oxide,
microstructure,
pulsed laser deposition,
thin films
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2014 P. Nagaraju, Y. Vijayakumar, D. Phase, V. Reddy, M. Ramana Reddy, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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