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Deep levels in GaN studied by deep level transient spectroscopy and Laplace transform deep-level spectroscopy Cover

Deep levels in GaN studied by deep level transient spectroscopy and Laplace transform deep-level spectroscopy

Materials Science-Poland
Volume 31 (2013): Issue 4 (October 2013)
By: Paulina Kamyczek,  Ewa Placzek-Popko,  Eunika Zielony and  Zbigniew Zytkiewicz  
Open Access
|Dec 2013

Authors

Paulina Kamyczek

paulina.kamyczek@pwr.wroc.pl

Ewa Placzek-Popko

Eunika Zielony

Zbigniew Zytkiewicz

DOI: https://doi.org/10.2478/s13536-013-0138-0 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 572 - 576
Published on: Dec 15, 2013
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
GaN,
DLTS,
LDLTS
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2013 Paulina Kamyczek, Ewa Placzek-Popko, Eunika Zielony, Zbigniew Zytkiewicz, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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