Investigation of physicochemical and tribological properties of transparent oxide semiconducting thin films based on Ti-V oxides Cover

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Investigation of physicochemical and tribological properties of transparent oxide semiconducting thin films based on Ti-V oxides

Materials Science-Poland

Volume 31 (2013): Issue 3 (August 2013)

By: M. Mazur, K. Sieradzka, D. Kaczmarek, J. Domaradzki, D. Wojcieszak and P. Domanowski

Open Access

|Aug 2013

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DOI: https://doi.org/10.2478/s13536-013-0122-8 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331

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Language: English

Page range: 434 - 445

Published on: Aug 29, 2013

Published by: Wroclaw University of Science and Technology

In partnership with: Paradigm Publishing Services

Publication frequency: 4 issues per year

Keywords:

Ti-V oxide thin films,

transparent oxide semiconductors,

magnetron sputtering,

tribological properties

Related subjects:

Materials sciences,

Materials sciences, other,

Functional and smart materials,

Materials characterization and properties

© 2013 M. Mazur, K. Sieradzka, D. Kaczmarek, J. Domaradzki, D. Wojcieszak, P. Domanowski, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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