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Investigation of physicochemical and tribological properties of transparent oxide semiconducting thin films based on Ti-V oxides Cover

Investigation of physicochemical and tribological properties of transparent oxide semiconducting thin films based on Ti-V oxides

Materials Science-Poland
Volume 31 (2013): Issue 3 (August 2013)
By: M. Mazur,  K. Sieradzka,  D. Kaczmarek,  J. Domaradzki,  D. Wojcieszak and  P. Domanowski  
Open Access
|Aug 2013

Authors

M. Mazur

michal.mazur@pwr.wroc.pl

K. Sieradzka

karolina.sieradzka@pwr.wroc.pl

D. Kaczmarek

J. Domaradzki

D. Wojcieszak

P. Domanowski

DOI: https://doi.org/10.2478/s13536-013-0122-8 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 434 - 445
Published on: Aug 29, 2013
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
Ti-V oxide thin films,
transparent oxide semiconductors,
magnetron sputtering,
tribological properties
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2013 M. Mazur, K. Sieradzka, D. Kaczmarek, J. Domaradzki, D. Wojcieszak, P. Domanowski, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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