Enhanced antireflective and laser damage resistance of refractive-index gradient SiO2 nanostructured films at 1064 nm
By: Lili Wan, Jie Yang, Xiaoru Liu, Jiayi Zhu, Gang Xu, Chenchun Hao, Xuecheng Chen and Zhengwei Xiong
Authors
Lili Wan
Joint Laboratory for Extreme Conditions Matter Properties, School of Mathematics and Physics, Southwest University of Science and Technology, Mianyang, China
Jie Yang
Joint Laboratory for Extreme Conditions Matter Properties, School of Mathematics and Physics, Southwest University of Science and Technology, Mianyang, China
Xiaoru Liu
Joint Laboratory for Extreme Conditions Matter Properties, School of Mathematics and Physics, Southwest University of Science and Technology, Mianyang, China
Jiayi Zhu
Joint Laboratory for Extreme Conditions Matter Properties, School of Mathematics and Physics, Southwest University of Science and Technology, Mianyang, China
Key Laboratory of Icing and Anti/De-icing, China Aerodynamics Research and Development Center, Mianyang, China
Gang Xu
Joint Laboratory for Extreme Conditions Matter Properties, School of Mathematics and Physics, Southwest University of Science and Technology, Mianyang, China
Chenchun Hao
Joint Laboratory for Extreme Conditions Matter Properties, School of Mathematics and Physics, Southwest University of Science and Technology, Mianyang, China
Xuecheng Chen
Department of Nanomaterials Physicochemistry, Faculty of Chemical Technology and Engineering, West Pomeranian University of Technology, Szczecin, Poland
Zhengwei Xiong
Joint Laboratory for Extreme Conditions Matter Properties, School of Mathematics and Physics, Southwest University of Science and Technology, Mianyang, China
DOI: https://doi.org/10.2478/pjct-2024-0014 | Journal eISSN: 3072-0389
Language: English
Page range: 25 - 30
Published on: Jul 12, 2024
Published by: West Pomeranian University of Technology, Szczecin
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
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© 2024 Lili Wan, Jie Yang, Xiaoru Liu, Jiayi Zhu, Gang Xu, Chenchun Hao, Xuecheng Chen, Zhengwei Xiong, published by West Pomeranian University of Technology, Szczecin
This work is licensed under the Creative Commons Attribution 4.0 License.