Fig. 1.
Fig. 2.
Fig. 3.
Fig. 4.
Fig. 5.
Fig. 6.
Fig. 7.
Results obtained from different analytical techniques performed on coin A (surface and cross-section)
| Analytical technique | Ag (%) | Cu (%) | Zn (%) |
|---|---|---|---|
| ED-XRF (surface) | 94.63 | 2.77 | 2.59 |
| μ-XRF Layer 1 | 64.69 | 29.91 | 5.41 |
| μ-XRF Layer 2 | 53.15 | 31.90 | 14.95 |
| μ-XRF Layer 3 | 73.81 | 20.37 | 5.82 |
| SEM-EDS (surface) | 94.25 | 3.20 | 2.55 |
| SEM-EDS (cross-section) Point 1 | 92.06 | 4.13 | 3.29 |
| SEM-EDS (cross-section) Point 2 | 91.69 | 3.98 | 4.33 |
| SEM-EDS (cross-section) Point 3 | 8.23 | 77.40 | 13.57 |
| SEM-EDS (cross-section) Point 4 | 11.10 | 88.90 | <LLD |
| SEM-EDS (cross-section) Point 5 | 8.42 | 75.14 | 16.43 |
| SEM-EDS (cross-section) Point 6 | 32.91 | 53.16 | 10.95 |
| SEM-EDS average | 40.74 | 50.45 | 8.10 |
| μ-PIXE (cross-section) Area 1 | 42.88 | 46.68 | 10.44 |
| μ-PIXE (cross-section) Area 2 | 52.41 | 46.02 | 2.57 |
| μ-PIXE (cross-section) Area 3 | 67.33 | 29.94 | 2.73 |
Results obtained from different analytical techniques performed on coin B
| Analytical technique | Ag (%) | Cu (%) | Zn (%) |
|---|---|---|---|
| ED-XRF (surface) | 96.23 | 3.07 | 0.71 |
| SEM-EDS (surface) | 97.97 | 2.03 | <LLD |
| XRF (surface) | 90.27 | 5.85 | 3.88 |