Authors
Jie Xu
Chengdu University of Technology, Chengdu, China
Jiawen Fan
Chengdu University of Technology, Chengdu, China
Rui Li
Chengdu University of Technology, Chengdu, China
Hui Li
Chengdu University of Technology, Chengdu, China
Weiqi Huang
Army Chemical Defense Academy, Beijing, China
Biao Yuan
Army Chemical Defense Academy, Beijing, China