Authors
Shengdan Zhang
Key Laboratory of Ultrafast Photoelectric Diagnostic Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
University of Chinese Academy of Sciences, Beijing, China
Yonglin Bai
Key Laboratory of Ultrafast Photoelectric Diagnostic Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Weiwei Cao
Key Laboratory of Ultrafast Photoelectric Diagnostic Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
University of Chinese Academy of Sciences, Beijing, China
Junjun Qin
Key Laboratory of Ultrafast Photoelectric Diagnostic Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Jiarui Gao
Key Laboratory of Ultrafast Photoelectric Diagnostic Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Beihong Liu
North Night Vision Technology Co., Ltd, Kunming, China
Zhujun Chu
North Night Vision Technology Co., Ltd, Kunming, China
Xiaoqing Cong
Nanjing Branch of North Night Vision Technology Co., Ltd, Nanjing, China
Yongwei Dong
Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, China
Zhigang Wang
Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, China