Authors
Hua Zhuo
Instrument Science and Technology, Department of Automation, Nanjing University of Aeronautics and Astronautics, China
Thermal Metrology Testing Institute, Xinjiang Uygur Autonomous Region Research Institute of Measurement & Testing, Urumqi, China
Yan Xu
School of Mechanical Engineering, Xinjiang University, Xinjiang University Boduo Campus, Urumqi, China
Weihu Zhou
Institute of Microelectronics, Chinese Academy of Sciences, University of Chinese Academy of Sciences, Beijing, China
Feng Li
Thermal Metrology Testing Institute, Xinjiang Uygur Autonomous Region Research Institute of Measurement & Testing, Urumqi, China
Yikun Zhao
Thermal Metrology Testing Institute, Xinjiang Uygur Autonomous Region Research Institute of Measurement & Testing, Urumqi, China