An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet
By: Erhan Tiryaki, Özlem Kocahan and Serhat Özder
Authors
Erhan Tiryaki
Department of Physics, School of Graduate Studies, Canakkale Onsekiz Mart University, Canakkale, Turkey
Özlem Kocahan
Department of Physics, Faculty of Arts and Sciences, Namik Kemal University, Tekirdag, Turkey
Serhat Özder
Department of Physics, Faculty of Arts and Sciences, Canakkale Onsekiz Mart University, Canakkale, Turkey
DOI: https://doi.org/10.2478/msr-2021-0009 | Journal eISSN: 1335-8871
Language: English
Page range: 61 - 66
Submitted on: Mar 23, 2021
Accepted on: May 3, 2021
Published on: May 21, 2021
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
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© 2021 Erhan Tiryaki, Özlem Kocahan, Serhat Özder, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.