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An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet Cover

An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

Measurement Science Review
Volume 21 (2021): Issue 2 (April 2021)
By: Erhan Tiryaki,  Özlem Kocahan and  Serhat Özder  
Open Access
|May 2021

Authors

Erhan Tiryaki

erhantiryaki@gmail.com

Department of Physics, School of Graduate Studies, Canakkale Onsekiz Mart University, Canakkale, Turkey

Özlem Kocahan

Department of Physics, Faculty of Arts and Sciences, Namik Kemal University, Tekirdag, Turkey

Serhat Özder

Department of Physics, Faculty of Arts and Sciences, Canakkale Onsekiz Mart University, Canakkale, Turkey
DOI: https://doi.org/10.2478/msr-2021-0009 | Journal eISSN: 1335-8871
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Language: English
Page range: 61 - 66
Submitted on: Mar 23, 2021
|
Accepted on: May 3, 2021
|
Published on: May 21, 2021
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Dielectric film,
refractive index,
reflectance spectrum,
continuous wavelet transform,
generalized Morse wavelet
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2021 Erhan Tiryaki, Özlem Kocahan, Serhat Özder, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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