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Non-destructive Dielectric Measurements and Calibration for Thin Materials Using Waveguide-Coaxial Adaptors Cover

Non-destructive Dielectric Measurements and Calibration for Thin Materials Using Waveguide-Coaxial Adaptors

Measurement Science Review
Volume 14 (2014): Issue 1 (February 2014)
By: K. Y. You,  Z. Abbas,  M. F. A. Malek and  E. M. Cheng  
Open Access
|Mar 2014

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DOI: https://doi.org/10.2478/msr-2014-0003 | Journal eISSN: 1335-8871
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Language: English
Page range: 16 - 24
Published on: Mar 6, 2014
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Relative permittivity,
thin materials,
rectangular waveguide,
reflection coefficient,
one-port calibration,
admittance aperture
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2014 K. Y. You, Z. Abbas, M. F. A. Malek, E. M. Cheng, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons License.

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