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Effect of evaporation rate and substrate temperature on optical, structural, and electrical properties of ZnTe:Sb films deposited by thermal evaporation of Zn, Te, and Sb sources Cover

Effect of evaporation rate and substrate temperature on optical, structural, and electrical properties of ZnTe:Sb films deposited by thermal evaporation of Zn, Te, and Sb sources

Open Access
|Jun 2025

Figures & Tables

Figure 1

XRD patterns of the prepared films.
XRD patterns of the prepared films.

Figure 2

EDX spectra of films Za1 to Za4.
EDX spectra of films Za1 to Za4.

Figure 3

SEM micrographs of films Za4 (with two resolutions), Zb1, and Zb3.
SEM micrographs of films Za4 (with two resolutions), Zb1, and Zb3.

Figure 4

A plot of ln(σ) against 1/kT along with the linear fit of the data.
A plot of ln(σ) against 1/kT along with the linear fit of the data.

Figure 5

A plot of ln(σ) against 1/kT of the films.
A plot of ln(σ) against 1/kT of the films.

Figure 6

A plot of transmittance against wavelength of all deposited films.
A plot of transmittance against wavelength of all deposited films.

Figure 7

Transmittance data along with the fitting curve of Zb4.
Transmittance data along with the fitting curve of Zb4.

Figure 8

A plot of (αhν)2 against photon energy (hν).
A plot of (αhν)2 against photon energy (hν).

EDX and conductivity results_

Film numberZn ratio element % (±2%)Te ratio element % (±2%)Sb ratio element % (±2%)Resistivity at 30°C (Ω-cm)Conductivity activation energy (eV)
Za150.4449.568.93 × 106 0.68
Za250.3347.272.441.62 × 102 0.21
Za349.5444.288.181.34 × 101 0.09
Za449.2837.7612.963.30 × 10−1 0.06
Zb150.1449.866.72 × 107 0.76
Zb250.1349.872.71 × 103 0.27
Zb350.1649.848.70 × 102 0.21
Zb450.1048.491. 412.72 × 102 0.18

Results of the calculated optical parameters_

Film numberThickness (nm)Root mean square roughness (nm) n = [ 1 + ( n 0 2 1 ) λ 2 / ( λ 2 λ 0 2 ) ] 1 / 2 n={{[}1+({n}_{0}^{2}-1){\lambda }^{2}/({\lambda }^{2}-{\lambda }_{0}^{2})]}^{1/2} Energy gap (eV)
n o λ o (nm)
Za1653 ± 312.3 ± 0.72.72 ± 0.01292.5 ± 1.12.25 ± 0.005
Za2756 ± 109.9 ± 0.52.94 ± 0.01299.7 ± 0.72.13 ± 0.005
Za3876 ± 316.0 ± 0.72.97 ± 0.01348 ± 1.51.95 ± 0.005
Za4954 ± 418.2 ± 1.03.06 ± 0.02363 ± 2.51.80 ± 0.005
Zb1660 ± 312.6 ± 0.72.71 ± 0.01294.8 ± 1.02.26 ± 0.005
Zb2616 ± 29.7 ± 0.82.72 ± 0.01298.5 ± 1.02.25 ± 0.005
Zb3601 ± 210.3 ± 0.62.76 ± 0.01295.9 ± 0.92.22 ± 0.005
Zb4582 ± 110.4 ± 0.52.81 ± 0.01286.7 ± 0.82.20 ± 0.005

Deposition parameters_

Film numberSubstrate temp. (°C)Sb source temp. (°C)Zn source temp. (°C)Te source temp. (°C)Sb evaporation rate (nm/s)
Za1250540480
Za22505605404801.1
Za32506005404802.9
Za42506405404805.2
Zb1350540480
Zb23505605404801.1
Zb33506005404802.9
Zb43506405404805.2
DOI: https://doi.org/10.2478/msp-2025-0020 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 78 - 86
Submitted on: May 9, 2025
Accepted on: Jun 26, 2025
Published on: Jun 30, 2025
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2025 Akram Aqili, Anas Y. Al-Reyahi, Mufeed Maghrabi, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.