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Improving optical and morphological properties of Mn-doped ZnO via Ar ion sputtering followed by high-temperature UHV annealing Cover

Improving optical and morphological properties of Mn-doped ZnO via Ar ion sputtering followed by high-temperature UHV annealing

Open Access
|Nov 2023

Figures & Tables

Fig. 1.

2D and 3D topographic AFM images accompanied by curves of line profiles corresponding to pure ZnO (a), untreated ZnMnO (b), and treated ZnMnO (c)
2D and 3D topographic AFM images accompanied by curves of line profiles corresponding to pure ZnO (a), untreated ZnMnO (b), and treated ZnMnO (c)

Fig. 2.

XRD spectra of undoped ZnO and treated ZnMnO With six pics (100), (002), (101), (102), (110) and (103)
XRD spectra of undoped ZnO and treated ZnMnO With six pics (100), (002), (101), (102), (110) and (103)

Fig. 3.

Size-strain analysis (W-H plot) for ZnO and ZnMnO
Size-strain analysis (W-H plot) for ZnO and ZnMnO

Fig. 4.

XPS spectra of pure ZnO (i), initial ZnMnO (ii), ZnMnO post Ar ion sputtering (iii), and ZnMnO post Ar annealing at 800°C (iv). (a): full scan spectra. (b), (c), (d), and (e): narrow scan spectra corresponding to C 1s, doubled Zn 2p, O 1s, and doubled Mn 2p, respectively
XPS spectra of pure ZnO (i), initial ZnMnO (ii), ZnMnO post Ar ion sputtering (iii), and ZnMnO post Ar annealing at 800°C (iv). (a): full scan spectra. (b), (c), (d), and (e): narrow scan spectra corresponding to C 1s, doubled Zn 2p, O 1s, and doubled Mn 2p, respectively

Fig. 5.

Gaussian deconvolution of high-resolution XPS spectrum of: (a) doubled Mn 2p corresponding to treated ZnMnO(final state); and (b) O 1s corresponding to ZnMnO (untreated, annealed)
Gaussian deconvolution of high-resolution XPS spectrum of: (a) doubled Mn 2p corresponding to treated ZnMnO(final state); and (b) O 1s corresponding to ZnMnO (untreated, annealed)

Fig. 6.

PL spectra of pure ZnO (i), untreated ZnMnO (ii), and treated ZnMnO (iii)
PL spectra of pure ZnO (i), untreated ZnMnO (ii), and treated ZnMnO (iii)

Fig. 7.

Gaussian fitting of PL spectra accompanied by schematic band diagram corresponding to pure ZnO (i), untreated ZnMnO (ii), and treated ZnMnO (iii)
Gaussian fitting of PL spectra accompanied by schematic band diagram corresponding to pure ZnO (i), untreated ZnMnO (ii), and treated ZnMnO (iii)

Structural parameters of ZnO and treated ZnMnO: tabulated XRD spectroscopy results

SamplePeak position (2θ °)hklFWHM (2θ°)d-spacing (Å)Average grain size D (nm)Cell parameters (Å)c/aStrain (ε)
Scherrer equationW-H Plota = bc Scherrer equationW-H Plot
ZnO(0%)31.841 000.582.8025.2028.883.2425.1951.6020.00140.00085
34.500020.332.60
36.321 0 10.302.47
47.651 020.331.90
56.681 1 00.361.62
63.021 030.831.47
ZnMnO(4%)31.701 000.562.8212.4112.383.2565.2121.6000.00250.00122
34.380020.672.60
36.171 0 10.362.48
47.561 020.291.91
56.441 1 00.211.63
62.871 030.301.47

Atomic percentages of Zn, O, and Mn elements corresponding to pure ZnO and treated ZnMnO_ (a) atomic ratio of the Mn atoms taking the Zn sites_ (b) stoichiometry factor of O to Zn and Mn

Sampleat(%)Comments
ZnOMn(a): [Mn][Mn+Zn]×100${{[Mn]} \over {[Mn + Zn]}} \times 100$(b): [O][Mn+Zn]${{[O]} \over {[Mn + Zn]}}$
ZnO34.0066.000.000.001.94
ZnMnO@800°C22.3074.043.6514.072.85

The main statistical parameters calculated through the AFM images in Figure 1 using Gwyddion software

SampleMaximum height (Zmax) (nm)Median height (Zmed) (nm)Mean roughness (Sa) (nm)Number of grains (N)
ZnO98.8460.2213.50115
Untreated ZnMnO198.0106.4627.05152
Treated ZnMnO288.84132.5243.03126
DOI: https://doi.org/10.2478/msp-2023-0024 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 325 - 338
Submitted on: Mar 22, 2023
Accepted on: Sep 17, 2023
Published on: Nov 29, 2023
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2023 Elhachemi Zehar, Abdallah Ouerdane, Boualem Chetti, Ali Çoruh, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.