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Optical characterization of thin Al2O3 layers deposited by magnetron sputtering technique at industrial conditions for applications in glazing Cover

Optical characterization of thin Al2O3 layers deposited by magnetron sputtering technique at industrial conditions for applications in glazing

Materials Science-Poland
Volume 38 (2020): Issue 1 (March 2020)
By: Piotr Dywel and  Łukasz Skowroński  
Open Access
|May 2020
DOI: https://doi.org/10.2478/msp-2019-0093 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 108 - 115
Submitted on: Aug 18, 2018
Accepted on: Feb 19, 2019
Published on: May 8, 2020
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
AlO,
GIMS,
refractive index,
light transmittance,
glazing
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2020 Piotr Dywel, Łukasz Skowroński, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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