References
- [1] L
ines M.E., Glass A.M., Principles and Applications of ferroelectric and related material, Oxford University Press, New York, 1977. - [2] D
auber M., Rabe K.M., Scott J., Rev. Mod. Phys., 77 (2005), 1083. - [3] T
wieg R., Azema A., Jain K., Cheng Y.Y., Chem. Phys. Lett., 92 (1982), 208. - [4] C
urrie M., Speakman J.C., Curry N.A., J. Chem. Soc. A, (1967), 1862. - [5] J
erusha E., Kumar R.I.S., Kirupavathy S.S., Gopalakrishnan R., Optik, 127 (2016), 3896. - [6] A
mirkhanyan Z.G., Remedios C.M., Mascarenhas Y.P., Morelhao S.L., J. Appl. Cryst., 47 (2014), 160. - [7] S
oares A.S., Caspar D.L., Weckert E., Heroux A., Hoelzer K., Schroer K., Zellner J., Schneider D., Nolan W., Sweet R.M., Acta Cryst. Sec. D: Bio. Cryst., 59 (2003), 1716. - [8] C
olthup N.B., J. Opt. Soc. Am., 40 (1950), 397. - [9] K
ubelka P., J. Opt. Soc. Am., 44 (1954), 330. - [10] B
urgeth G., Kisch H., Coord. Chem. Rev., 230 (2002), 41. - [11] M
ersch M., Buse K., Sauf W., Hesse H., Kratzig E., Phys. Status Solidi, 140 (1993), 273. - [12] B
ardeen J., Blatt F.J., Hall L.H., Proceedings of the Photoconductivity conference, Atlantic City, Wiley, New York, (1956), 146. - [13] S
chmcisser D., Rager A., Thonke K., Pilkuhn M., Frohlich D., Gaauglitz G., Schafer M., Oelkrug D., Synth. Met., 41 (1991), 1457. - [14] F
ang Z., Lin J., Liu R., Liu P., Li Y., Huang X., Ding K., Ning L., Zhang Y., Cryst. Eng. Commun., 16 (2014), 10569. - [15] S
enthil K., Kalainathan S., Kumar A.R., Aravindan P.G., RSC Adv., 4 (2014), 56112. - [16] D
alal J., Sinha N., Kumar B., Opt. Mater., 37 (2014), 457. - [17] A
nis M., Shirsat M.D., Hussaini S.S., Joshi B., Muley G.G., J. Mat. Sci. Tech., 32 (2016), 62. - [18] G
irisun T.C.S., Dhanuskodi S., Cryst. Res. Technol., 44 (2009), 1297. - [19] A
rumanayagam T., Murugakoothan P., J. Min. Mater. Char. Eng., 13 (2011), 1225. - [20] U
gwu E.I., Olayinka A.S., Olabode F.I., J. Eng. Appl. Sci., 4 (2009), 126. - [21] G
upta V., Mansingh A., J. Appl. Phys., 80 (1996), 1063. - [22] L
i H., Han Y.H., Bradt R.C., J. Mater. Sci., 29 (1994), 5641-5645. - [23] K
unjomana A.G., Chandrasekharan K.A., Cryst. Res. Technol., 40 (2005), 782. - [24] S
angwal K., Mater. Chem. Phys., 63 (2000), 145. - [25] W
ooster W.A., Rep. Prog. Phys., 16 (1953), 62. - [26] K
rishnan S., Raj C.J., Robert R., Ramanand A., Das S.J., Soli. Stat. Elect., 52 (2008), 1157. - [27] V
onhippel A.R., Materials and Applications, New York, (1965), 79. - [28] S
heik -Bahae M., Said A.A., Wei T., Hagan D.J., Stryland E.W.V., IEEE J. Quant. Elect., 26 (1990), 760.