Stereometric analysis of Ta2O5 thin films
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DOI: https://doi.org/10.2478/msp-2019-0083 | Journal eISSN: 2083-134X (formerly 2083-124X) | Journal ISSN: 2083-1331
Language: English
Submitted on: Oct 4, 2018
Accepted on: Apr 23, 2019
Published on: Jan 10, 2020
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
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© 2020 Dinara Sobola, Pavel Kaspar, Jindrich Oulehla, Ştefan Ţălu, Nikola Papež, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.