Stereometric analysis of Ta2O5 thin films Cover

.blurhash-client-img { display: none !important; }

Stereometric analysis of Ta2O5 thin films

Materials Science-Poland

By: Dinara Sobola, Pavel Kaspar, Jindrich Oulehla, Ştefan Ţălu and Nikola Papež

Open Access

|Jan 2020

Authors

Dinara Sobola

Brno University of Technology, Faculty of Electrical Engineering and Communication, Physics Department, Brno

Pavel Kaspar

kasparp@feec.vutbr.cz

Brno University of Technology, Faculty of Electrical Engineering and Communication, Physics Department, Brno

Jindrich Oulehla

Brno University of Technology, Faculty of Electrical Engineering and Communication, Physics Department, Brno

Ştefan Ţălu

Technical University of Cluj-Napoca, The Directorate of Research, Development and Innovation Management (DMCDI), Cluj-Napoca, Romania

Nikola Papež

Brno University of Technology, Faculty of Electrical Engineering and Communication, Physics Department, Brno

DOI: https://doi.org/10.2478/msp-2019-0083 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331

Journal RSS Feed

Language: English

Submitted on: Oct 4, 2018

|

Accepted on: Apr 23, 2019

|

Published on: Jan 10, 2020

Published by: Wroclaw University of Science and Technology

In partnership with: Paradigm Publishing Services

Publication frequency: 4 issues per year

Keywords:

atomic force microscopy,

stereometric analysis,

Related subjects:

Materials sciences,

Materials sciences, other,

Functional and smart materials,

Materials characterization and properties

© 2020 Dinara Sobola, Pavel Kaspar, Jindrich Oulehla, Ştefan Ţălu, Nikola Papež, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.