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Characterization of the native oxide on CdTe surfaces Cover

Characterization of the native oxide on CdTe surfaces

Materials Science-Poland
Volume 37 (2019): Issue 2 (June 2019)
By: Dinara Sobola,  Pavel Kaspar,  Alois Nebojsa,  Dušan Hemzal,  Lubomír Grmela and  Steve Smith  
Open Access
|Aug 2019

Authors

Dinara Sobola

sobola@vutbr.cz

Brno University of Technology, Faculty of Electrical Engineering and Communication, Physics Department, Brno
Central European Institute of Technology BUT, Brno

Pavel Kaspar

Brno University of Technology, Faculty of Electrical Engineering and Communication, Physics Department, Brno

Alois Nebojsa

Central European Institute of Technology BUT, Brno

Dušan Hemzal

Department of Condensed Matter Physics, Faculty of Science, Masaryk University, Brno

Lubomír Grmela

Brno University of Technology, Faculty of Electrical Engineering and Communication, Physics Department, Brno
Central European Institute of Technology BUT, Brno

Steve Smith

South Dakota School of Mines, EP220, Electrical Engineering and Physics, Rapid City
DOI: https://doi.org/10.2478/msp-2019-0030 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 206 - 211
Submitted on: Mar 22, 2018
|
Accepted on: Mar 18, 2019
|
Published on: Aug 2, 2019
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
selective etching,
scanning probe microscopy,
ellipsometry,
Raman spectroscopy
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2019 Dinara Sobola, Pavel Kaspar, Alois Nebojsa, Dušan Hemzal, Lubomír Grmela, Steve Smith, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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