Use of scanning area related multiple degradation profiles for AFM assessment of polystyrene/PC61BM nanocomposite surface deterioration Cover

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Use of scanning area related multiple degradation profiles for AFM assessment of polystyrene/PC61BM nanocomposite surface deterioration

Materials Science-Poland

Volume 36 (2018): Issue 3 (September 2018)

By: Andrzej Sikora, Magdalena Moczała and Bartosz Boharewicz

Open Access

|Nov 2018

Authors

Andrzej Sikora

sikora@iel.wroc.pl

Electrotechnical Institute, Division of Electrotechnology and Materials Science, Wrocław, Poland

Magdalena Moczała

Electrotechnical Institute, Division of Electrotechnology and Materials Science, Wrocław, Poland

Bartosz Boharewicz

Electrotechnical Institute, Division of Electrotechnology and Materials Science, Wrocław, Poland

DOI: https://doi.org/10.2478/msp-2018-0071 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331

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Language: English

Page range: 397 - 402

Submitted on: Mar 27, 2017

|

Accepted on: Jun 12, 2018

|

Published on: Nov 2, 2018

Published by: Wroclaw University of Science and Technology

In partnership with: Paradigm Publishing Services

Publication frequency: 4 issues per year

Keywords:

atomic force microscopy,

surface roughness,

precise positioning,

surface degradation,

polystyrene nanocomposite

Related subjects:

Materials sciences,

Materials sciences, other,

Functional and smart materials,

Materials characterization and properties

© 2018 Andrzej Sikora, Magdalena Moczała, Bartosz Boharewicz, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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