Authors
Rui Wang
School of Integrated Circuits, Guangdong University of Technology, Guangzhou, China
Jian Liu
School of Integrated Circuits, Guangdong University of Technology, Guangzhou, China
Kang Zeng
School of Integrated Circuits, Guangdong University of Technology, Guangzhou, China
Di Luo
School of Integrated Circuits, Guangdong University of Technology, Guangzhou, China