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Reliability improvement of electrically active defect investigations by analytical and experimental deep level transient: Fourier spectroscopy investigations Cover

Reliability improvement of electrically active defect investigations by analytical and experimental deep level transient: Fourier spectroscopy investigations

Journal of Electrical Engineering
Volume 70 (2019): Issue 7 (December 2019)
By: Arpad Kosa,  Beata Sciana and  Lubica Stuchlikova  
Open Access
|Sep 2019

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DOI: https://doi.org/10.2478/jee-2019-0038 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 27 - 35
Submitted on: Mar 19, 2019
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Published on: Sep 28, 2019
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
deep level transient Fourier spectroscopy,
Arrhenius data analysis,
electrically active defects,
GaAs p-i-n,
deep energy level
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2019 Arpad Kosa, Beata Sciana, Lubica Stuchlikova, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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