Reliability improvement of electrically active defect investigations by analytical and experimental deep level transient: Fourier spectroscopy investigations
By: Arpad Kosa, Beata Sciana and Lubica Stuchlikova
Authors
Arpad Kosa
Institute of Electronics and Photonics, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia
Beata Sciana
Division of Microelectronics and Nanotechnology, Faculty of Microsystem Electronics and Photonics, Wroclaw University of Science and Technology, Wroclaw, Poland
Lubica Stuchlikova
Institute of Electronics and Photonics, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia
Language: English
Page range: 27 - 35
Submitted on: Mar 19, 2019
Published on: Sep 28, 2019
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
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© 2019 Arpad Kosa, Beata Sciana, Lubica Stuchlikova, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.