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An Efficient Functional Test Generation Method For Processors Using Genetic Algorithms Cover

An Efficient Functional Test Generation Method For Processors Using Genetic Algorithms

Journal of Electrical Engineering
Volume 66 (2015): Issue 4 (July 2015)
By: Ján Hudec and  Elena Gramatová  
Open Access
|Sep 2015
Articles in this issue
DOI: https://doi.org/10.2478/jee-2015-0031 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 185 - 193
Submitted on: Sep 16, 2014
Published on: Sep 19, 2015
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
processor,
testing,
functional test,
test generation,
genetic algorithm,
evolutionary strategy
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2015 Ján Hudec, Elena Gramatová, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Volume 66 (2015): Issue 4 (July 2015)
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