An Efficient Functional Test Generation Method For Processors Using Genetic Algorithms

Ján Hudec; Elena Gramatová

doi:10.2478/jee-2015-0031

Abstract

The paper presents a new functional test generation method for processors testing based on genetic algorithms and evolutionary strategies. The tests are generated over an instruction set architecture and a processor description. Such functional tests belong to the software-oriented testing. Quality of the tests is evaluated by code coverage of the processor description using simulation. The presented test generation method uses VHDL models of processors and the professional simulator ModelSim. The rules, parameters and fitness functions were defined for various genetic algorithms used in automatic test generation. Functionality and effectiveness were evaluated using the RISC type processor DP32.

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An Efficient Functional Test Generation Method For Processors Using Genetic Algorithms

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