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Ohmic Conacts to p-GaN on the Basis of Carbon Nanomaterials Cover

Abstract

We have designed and verified a new structure for ohmic contacts to p-GaN based on a layer of carbon nanotubes (CNT), reduced graphene oxide (r-GO) and metallic layers of Cr, Pd and Au, namely in configurations Au/Cr/r-GO/CNT/p-GaN and Au/Pd/r-GO/CNT/p-GaN. The effects have been studied of the annealing temperature and the gas ambient upon the electrical properties of the contacts. Annealing of the Au/Pd/r-GO/CNT/p-GaN structure in air at 500°C for 1 minute resulted in linear I - V curves measured between planar electrodes on the p-GaN. Hence, addition of r-GO to the CNT interlayer between p-GaN and the metallization layer is a highly promising procedure for further improvements of the ohmic contacts to p-GaN.

DOI: https://doi.org/10.2478/jee-2014-0063 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
Language: English
Page range: 386 - 389
Submitted on: Mar 15, 2014
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Published on: Jan 31, 2015
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year

© 2015 Liday Jozef, Vogrinčič Peter, Vretenár Viliam, Kotlár Mário, Marton Marián, Mikolášek Miroslav, Řeháček Vlastimil, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.