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Structural Characterization of Doped Thick Gainnas Layers - Ambiguities and Challenges Cover

Structural Characterization of Doped Thick Gainnas Layers - Ambiguities and Challenges

Journal of Electrical Engineering
Volume 65 (2014): Issue 5 (September 2014)
By: Damian Pucicki,  Katarzyna Bielak,  Beata Ściana,  Wojciech Dawidowski,  Karolina Żelazna,  Jarosław Serafińczuk,  Jaroslav Kováč,  Andrej Vincze,  Łukasz Gelczuk and  Piotr Dłużewski  
Open Access
|Nov 2014

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DOI: https://doi.org/10.2478/jee-2014-0048 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 299 - 303
Submitted on: Jun 15, 2014
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Published on: Nov 5, 2014
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
dilute nitrides,
GaInNAs,
composition determination,
HRXRD
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2014 Damian Pucicki, Katarzyna Bielak, Beata Ściana, Wojciech Dawidowski, Karolina Żelazna, Jarosław Serafińczuk, Jaroslav Kováč, Andrej Vincze, Łukasz Gelczuk, Piotr Dłużewski, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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