Have a personal or library account? Click to login
Automatic Analysis and Anomaly Detection System of Transverse Electron Beam Profile Based on Advanced and Interpretable Deep Learning Architectures Cover

Automatic Analysis and Anomaly Detection System of Transverse Electron Beam Profile Based on Advanced and Interpretable Deep Learning Architectures

Journal of Artificial Intelligence and Soft Computing Research
Volume 14 (2024): Issue 2 (March 2024)
By: Michał Piekarski,  Joanna Jaworek-Korjakowska and  Adriana Wawrzyniak  
Open Access
|Mar 2024

Metrics

DOI: https://doi.org/10.2478/jaiscr-2024-0008
Journal RSS Feed
Language: English
Page range: 139 - 156
Submitted on: Jun 10, 2023
Accepted on: Dec 13, 2023
Published on: Mar 19, 2024
Published by: SAN University
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
signal analysis,
anomaly detection,
transfer learning,
convolutional neural networks,
Synchrotron Radiation System
Related subjects:
Computer sciences,
Databases and data mining,
Artificial intelligence

© 2024 Michał Piekarski, Joanna Jaworek-Korjakowska, Adriana Wawrzyniak, published by SAN University
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Previous articleVolume 14 (2024): Issue 2 (March 2024)Next article