Passcrack: cracking, hashing, and strength testing for a secure digital future
Authors
Pooja Bagane
Department of Computer Science and Engineering, Symbiosis Institute of Technology - Pune Campus, Symbiosis International (Deemed University), Pune, India
Mokshada Sable
Department of Computer Science and Engineering, Symbiosis Institute of Technology - Pune Campus, Symbiosis International (Deemed University), Pune, India
Aarohi Panicker
Department of Computer Science and Engineering, Symbiosis Institute of Technology - Pune Campus, Symbiosis International (Deemed University), Pune, India
Anujesh Ansh
Department of Computer Science and Engineering, Symbiosis Institute of Technology - Pune Campus, Symbiosis International (Deemed University), Pune, India
Obsa Amenu Jebessa
Department of Information Technology, Jimma Institute of Technology, Jimma, Ethiopia
DOI: https://doi.org/10.2478/ijssis-2025-0024 | Journal eISSN: 1178-5608
Language: English
Submitted on: Jan 9, 2025
Published on: Jun 10, 2025
Published by: International Journal on Smart Sensing and Intelligent Systems
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
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© 2025 Pooja Bagane, Mokshada Sable, Aarohi Panicker, Anujesh Ansh, Obsa Amenu Jebessa, published by International Journal on Smart Sensing and Intelligent Systems
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.