Download Article
Download the full article as a PDF file.
CC-De-YOLO: A Multiscale Object Detection Method for Wafer Surface Defect
By: Jianhong Ma, Tao Zhang, Xiaoyan Ma and Hui Tian
Language: English
Page range: 261 - 285
Submitted on: Sep 17, 2023
Accepted on: May 19, 2024
Published on: Sep 19, 2024
Published by: Poznan University of Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
Related subjects:
© 2024 Jianhong Ma, Tao Zhang, Xiaoyan Ma, Hui Tian, published by Poznan University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.