CC-De-YOLO: A Multiscale Object Detection Method for Wafer Surface Defect
By: Jianhong Ma, Tao Zhang, Xiaoyan Ma and Hui Tian
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DOI: https://doi.org/10.2478/fcds-2024-0014 | Journal eISSN: 2300-3405 (formerly 0867-6356) | Journal ISSN: 0867-6356
Language: English
Page range: 261 - 285
Submitted on: Sep 17, 2023
Accepted on: May 19, 2024
Published on: Sep 19, 2024
Published by: Poznan University of Technology
In partnership with: Paradigm Publishing Services
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© 2024 Jianhong Ma, Tao Zhang, Xiaoyan Ma, Hui Tian, published by Poznan University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.