CC-De-YOLO: A Multiscale Object Detection Method for Wafer Surface Defect
By: Jianhong Ma, Tao Zhang, Xiaoyan Ma and Hui Tian
Authors
Jianhong Ma
Zhengzhou University, Cyber Science and Engineering, ZhangZhou, China
Tao Zhang
Zhengzhou University, Cyber Science and Engineering, ZhangZhou, China
Language: English
Page range: 261 - 285
Submitted on: Sep 17, 2023
Accepted on: May 19, 2024
Published on: Sep 19, 2024
Published by: Poznan University of Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
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© 2024 Jianhong Ma, Tao Zhang, Xiaoyan Ma, Hui Tian, published by Poznan University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.