Authors
Jianhong Ma
Zhengzhou University, Cyber Science and Engineering, ZhangZhou, China
Tao Zhang
Zhengzhou University, Cyber Science and Engineering, ZhangZhou, China
CC-De-YOLO: A Multiscale Object Detection Method for Wafer Surface Defect
By: Jianhong Ma, Tao Zhang, Xiaoyan Ma and Hui Tian
Language: English
Page range: 261 - 285
Submitted on: Sep 17, 2023
Accepted on: May 19, 2024
Published on: Sep 19, 2024
Published by: Poznan University of Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
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© 2024 Jianhong Ma, Tao Zhang, Xiaoyan Ma, Hui Tian, published by Poznan University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.