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Software Measurement and Defect Prediction with Depress Extensible Framework
By: Lech Madeyski and Marek Majchrzak
Language: English
Page range: 249 - 270
Published on: Dec 20, 2014
Published by: Poznan University of Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
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© 2014 Lech Madeyski, Marek Majchrzak, published by Poznan University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.