Have a personal or library account? Click to login
Codes Correcting Limited Patterns of Random Errors Using S-K Metric Cover

Codes Correcting Limited Patterns of Random Errors Using S-K Metric

By: Bhu Dev Sharma and  Ankita Gaur  
Open Access
|Mar 2013
DOI: https://doi.org/10.2478/cait-2013-0004 | Journal eISSN: 1314-4081 | Journal ISSN: 1311-9702
Language: English
Page range: 34 - 45
Published on: Mar 22, 2013
Published by: Bulgarian Academy of Sciences, Institute of Information and Communication Technologies
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2013 Bhu Dev Sharma, Ankita Gaur, published by Bulgarian Academy of Sciences, Institute of Information and Communication Technologies
This work is licensed under the Creative Commons License.