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Codes Correcting Limited Patterns of Random Errors Using S-K Metric Cover

Codes Correcting Limited Patterns of Random Errors Using S-K Metric

Cybernetics and Information Technologies
Volume 13 (2013): Issue 1 (March 2013)
By: Bhu Dev Sharma and  Ankita Gaur  
Open Access
|Mar 2013
Authors

Authors

Bhu Dev Sharma

Ankita Gaur

ankitagaur50@yahoo.com

DOI: https://doi.org/10.2478/cait-2013-0004 | Journal eISSN: 1314-4081 | Journal ISSN: 1311-9702
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Language: English
Page range: 34 - 45
Published on: Mar 22, 2013
Published by: Bulgarian Academy of Sciences, Institute of Information and Communication Technologies
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
Hamming distance,
S-K metric,
error patterns,
error control in codes,
bounds
Related subjects:
Computer sciences,
Information technology

© 2013 Bhu Dev Sharma, Ankita Gaur, published by Bulgarian Academy of Sciences, Institute of Information and Communication Technologies
This work is licensed under the Creative Commons License.

Volume 13 (2013): Issue 1 (March 2013)
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