Authors
R. Yamanoglu
Metallurgical and Materials Engineering, Kocaeli University, Kocaeli, Turkey
E. Fazakas
Semilab Semiconductor Physics Laboratory Co. Ltd., Budapest, Hungary
F. Ahnia
Department of Mechanical Engineering, Faculty of Technology, University A/Mira Bejaia, Algeria
D. Alontseva
School of Information Technologies and Intelligent Systems, D. Serikbayev East Kazakhstan Technical University, Kazakhstan
F. Khoshnaw
School of Engineering and Sustainable Development, De Montfort University, Leicester