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Cr/Fe Ratio by Xps Spectra of Magnetoelectropolished Aisi 316L SS Using Linear, Shirley and Tougaard Methods of Background Subtraction Cover

Cr/Fe Ratio by Xps Spectra of Magnetoelectropolished Aisi 316L SS Using Linear, Shirley and Tougaard Methods of Background Subtraction

Advances in Materials Science
Volume 13 (2013): Issue 1 (March 2013)
By:  and    
Open Access
|Jul 2013
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DOI: https://doi.org/10.2478/adms-2013-0002 | Journal eISSN: 2083-4799 | Journal ISSN: 1730-2439
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Language: English
Page range: 11 - 20
Published on: Jul 10, 2013
Published by: Gdansk University of Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
XPS spectra fitting,
Linear,
Shirley,
Tougaard Backgrounds,
316L SS,
Magnetoelectropolishing MEP,
Cr/Fe ratio
Related subjects:
Materials sciences,
Functional and smart materials

© 2013 K. Rokosz, T. Hryniewicz, published by Gdansk University of Technology
This work is licensed under the Creative Commons License.

Volume 13 (2013): Issue 1 (March 2013)
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