Particle characterization system for industrial and naval applications
Metrics
DOI: https://doi.org/10.21307/ijssis-2019-059 | Journal eISSN: 1178-5608
Language: English
Page range: 1 - 5
Published on: Feb 15, 2020
Published by: Professor Subhas Chandra Mukhopadhyay
In partnership with: Paradigm Publishing Services
Publication frequency: 1 issue per year
Keywords:
Related subjects:
© 2020 Eric Ebert, Kay Domke, Willfried Kröger, Nils Andreas Damaschke, published by Professor Subhas Chandra Mukhopadhyay
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.