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Particle characterization system for industrial and naval applications Cover

Particle characterization system for industrial and naval applications

International Journal on Smart Sensing and Intelligent Systems
Volume 7 (2014): Issue 5 (January 2014)
By: Eric Ebert,  Kay Domke,  Willfried Kröger and  Nils Andreas Damaschke  
Open Access
|Feb 2020

Authors

Eric Ebert

eric.ebert@uni-rostock.de

University of Rostock Institute of General Electrical Engineering Rostock, Rostock, Germany

Kay Domke

kay.domke@uni-rostock.de

University of Rostock Institute of General Electrical Engineering Rostock, Rostock, Germany

Willfried Kröger

willfried.kroeger@uni-rostock.de

University of Rostock Institute of General Electrical Engineering Rostock, Rostock, Germany

Nils Andreas Damaschke

nils.damaschke@uni-rostock.de

University of Rostock Institute of General Electrical Engineering Rostock, Rostock, Germany
DOI: https://doi.org/10.21307/ijssis-2019-059 | Journal eISSN: 1178-5608
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Language: English
Page range: 1 - 5
Published on: Feb 15, 2020
Published by: Professor Subhas Chandra Mukhopadhyay
In partnership with: Paradigm Publishing Services
Publication frequency: 1 issue per year
Keywords:
particle charaterization,
particle classification,
interferometry,
industrial measurement,
naval measurement
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2020 Eric Ebert, Kay Domke, Willfried Kröger, Nils Andreas Damaschke, published by Professor Subhas Chandra Mukhopadhyay
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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