Authors
Ik Keun Park
Department of Mechanical &Automotive Engineering Seoul National University of Science and Technology Seoul, Seoul, Korea
Tae Sung Park
Department of Mechanical Engineering Hanyang University Seoul, Seoul, Korea
Thickness Measurement of Aluminum Thin Film using Dispersion Characteristic of Surface Acoustic Wave
By: Ik Keun Park and Tae Sung Park
DOI: https://doi.org/10.21307/ijssis-2019-049 | Journal eISSN: 1178-5608
Language: English
Page range: 1 - 4
Published on: Feb 15, 2020
Published by: Professor Subhas Chandra Mukhopadhyay
In partnership with: Paradigm Publishing Services
Publication frequency: 1 issue per year
Keywords:
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© 2020 Ik Keun Park, Tae Sung Park, published by Professor Subhas Chandra Mukhopadhyay
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.