Research On Chips’ Defect Extraction Based On Image-Matching
By: Daode Zhang, Yangliu Xue, Xuhui Ye and Yanli Li
Download Article
Download the full article as a PDF file.
DOI: https://doi.org/10.21307/ijssis-2017-658 | Journal eISSN: 1178-5608
Language: English
Page range: 321 - 336
Submitted on: Jul 20, 2013
Accepted on: Feb 12, 2014
Published on: Mar 10, 2014
Published by: Macquarie University, Australia
In partnership with: Paradigm Publishing Services
Publication frequency: 1 issue per year
Related subjects:
© 2014 Daode Zhang, Yangliu Xue, Xuhui Ye, Yanli Li, published by Macquarie University, Australia
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.