Research On Chips’ Defect Extraction Based On Image-Matching
By: Daode Zhang, Yangliu Xue, Xuhui Ye and Yanli Li
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DOI: https://doi.org/10.21307/ijssis-2017-658 | Journal eISSN: 1178-5608
Language: English
Page range: 321 - 336
Submitted on: Jul 20, 2013
Accepted on: Feb 12, 2014
Published online: Mar 10, 2014
Published in print: Jan 1, 2014
Published by: International Journal on Smart Sensing and Intelligent Systems
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
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© 2014 Daode Zhang, Yangliu Xue, Xuhui Ye, Yanli Li, published by International Journal on Smart Sensing and Intelligent Systems
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.