Research On Chips’ Defect Extraction Based On Image-Matching
By: Daode Zhang, Yangliu Xue, Xuhui Ye and Yanli Li
Authors
Daode Zhang
School of Mechanical Engineering, Hubei University of Technology, Wuhan, China
Yangliu Xue
School of Mechanical Engineering, Hubei University of Technology, Wuhan, China
Xuhui Ye
School of Mechanical Engineering, Hubei University of Technology, Wuhan, China
Yanli Li
School of Mechanical Engineering, Hubei University of Technology, Wuhan, China
DOI: https://doi.org/10.21307/ijssis-2017-658 | Journal eISSN: 1178-5608
Language: English
Page range: 321 - 336
Submitted on: Jul 20, 2013
Accepted on: Feb 12, 2014
Published online: Mar 10, 2014
Published in print: Jan 1, 2014
Published by: International Journal on Smart Sensing and Intelligent Systems
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Related subjects:
© 2014 Daode Zhang, Yangliu Xue, Xuhui Ye, Yanli Li, published by International Journal on Smart Sensing and Intelligent Systems
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.