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Research On Chips’ Defect Extraction Based On Image-Matching Cover

Research On Chips’ Defect Extraction Based On Image-Matching

International Journal on Smart Sensing and Intelligent Systems
Volume 7 (2014): Issue 1 (January 2014)
By: Daode Zhang,  Yangliu Xue,  Xuhui Ye and  Yanli Li  
Open Access
|Mar 2014

Authors

Daode Zhang

hgzdd@126.com

School of Mechanical Engineering, Hubei University of Technology, Wuhan, China

Yangliu Xue

School of Mechanical Engineering, Hubei University of Technology, Wuhan, China

Xuhui Ye

School of Mechanical Engineering, Hubei University of Technology, Wuhan, China

Yanli Li

School of Mechanical Engineering, Hubei University of Technology, Wuhan, China
DOI: https://doi.org/10.21307/ijssis-2017-658 | Journal eISSN: 1178-5608
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Language: English
Page range: 321 - 336
Submitted on: Jul 20, 2013
|
Accepted on: Feb 12, 2014
|
Published on: Mar 10, 2014
Published by: Professor Subhas Chandra Mukhopadhyay
In partnership with: Paradigm Publishing Services
Publication frequency: 1 issue per year
Keywords:
image matching,
subtraction,
dynamic selection of templates
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2014 Daode Zhang, Yangliu Xue, Xuhui Ye, Yanli Li, published by Professor Subhas Chandra Mukhopadhyay
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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