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The Effect of Residual Stress on Coupling Power Loss of VCSEL Modulus Cover

The Effect of Residual Stress on Coupling Power Loss of VCSEL Modulus

International Journal of Advanced Network, Monitoring and Controls
Volume 1 (2016): Issue 1 (January 2016)
By: Jao-Hwa Kuang,  Chao-Ming Hsu,  Ah-Der Lin and  Jyun-Wei Luo  
Open Access
|Apr 2018

Authors

Jao-Hwa Kuang

kuang@faculty.nsysu.edu.tw

Dept. of Mech. and Electro-Mech. Engr, National Sun Yat-Sen Univ, Kaohsiung, Taiwan

Chao-Ming Hsu

jammy@cc.kuas.edu.tw

Dept. of Mech. Engr, National Kaohsiung Univ. of App. Sci, Kaohsiung, Taiwan

Ah-Der Lin

ader@csu.edu.tw

Dept. of Mech. Engr, Cheng-Shiu Univ, Kaohsiung, Taiwan

Jyun-Wei Luo

Dept. of Mech. Engr, Cheng-Shiu Univ, Kaohsiung, Taiwan
DOI: https://doi.org/10.21307/ijanmc-2016-006 | Journal eISSN: 2470-8038
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Language: English
Page range: 1 - 4
Published on: Apr 1, 2018
Published by: Xi’an Technological University
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
VCSEL,
FEM,
Creep,
residual stresses,
misalignment
Related subjects:
Computer sciences,
Computer sciences, other

© 2018 Jao-Hwa Kuang, Chao-Ming Hsu, Ah-Der Lin, Jyun-Wei Luo, published by Xi’an Technological University
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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