The Effect of Residual Stress on Coupling Power Loss of VCSEL Modulus
By: Jao-Hwa Kuang, Chao-Ming Hsu, Ah-Der Lin and Jyun-Wei Luo
DOI: https://doi.org/10.21307/ijanmc-2016-006 | Journal eISSN: 2470-8038
Language: English
Page range: 1 - 4
Published on: Apr 1, 2018
Published by: Xi’an Technological University
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
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© 2018 Jao-Hwa Kuang, Chao-Ming Hsu, Ah-Der Lin, Jyun-Wei Luo, published by Xi’an Technological University
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.