Authors
John W. Sinn
Professor and Director of the Center for Quality, Measurement, and Automation in the College of Technology at Bowling Green State University, Ohio
DOI: https://doi.org/10.21061/jots.v24i1.a.7 | Journal eISSN: 1541-9258
Language: English
Page range: 38 - 41
Published on: Jan 1, 1998
Published by: Virginia Tech Publishing
In partnership with: Paradigm Publishing Services
© 1998 John W. Sinn, published by Virginia Tech Publishing
This work is licensed under the Creative Commons Attribution 4.0 License.
