A Three-Year Multi-Faculty Evaluation of 16 SI-PASS Schemes: Attendance Thresholds, Performance Gains, and Standardized Metrics
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DOI: https://doi.org/10.21061/jopl.143 | Journal eISSN: 2200-2359
Language: English
Page range: 3 - 3
Submitted on: Jun 9, 2025
Accepted on: Jun 17, 2026
Published on: Jul 29, 2026
Published by: Virginia Tech Publishing
In partnership with: Paradigm Publishing Services
© 2026 Ninon Puttaert, Dominique Toye, France Mélot, Catherine Colaux, Anne-Sophie Nyssen, Dominique Verpoorten, published by Virginia Tech Publishing
This work is licensed under the Creative Commons Attribution 4.0 License.