On the issue of quality of experience in technology supported learning
By: Kirsten Snyder, Luisa Panichi and Ola Lindberg
DOI: https://doi.org/10.16993/dfl.28 | Journal eISSN: 2001-7480
Language: English
Page range: 42 - 53
Published on: Dec 1, 2010
Published by: Stockholm University Press
In partnership with: Paradigm Publishing Services
© 2010 Kirsten Snyder, Luisa Panichi, Ola Lindberg, published by Stockholm University Press
This work is licensed under the Creative Commons Attribution 4.0 License.